- Ensure precise testing and aging of QFP64, LQFP64, and TQFP64 chips with our high-quality burn-in socket, designed for stability and reliability. - Ideal for semiconductor engineers, electronic lab technicians, and professionals who require dependable tools for chip testing and aging processes. - The socket's robust design delivers a secure fit, essential for accurate chip testing and efficient performance during extended aging tests. - Perfect for electronic manufacturing workshops conducting batch aging tests and laboratories that need to verify chip performance and long-term stability. - Lightweight, durable construction enhances usability and longevity, making it an indispensable tool in any electronic testing environment. - Compatibility with standard QFP chip sizes ensures versatile application across various projects and research. - Experience enhanced testing efficiency and results, benefiting from a tool that meets industry standards while simplifying complex testing protocols. Applications: 1. Utilize in research labs for validating the performance of newly developed semiconductor designs under stress-testing conditions. 2. Implement in manufacturing settings to conduct batch testing, ensuring that all chips meet quality and performance benchmarks before distribution. 3. Employ in educational environments for hands-on training of students in semiconductor technology and testing methodologies.